GDDR7 Memory Test System
M5512 GDDR7 Memory Test System
ATE-on-Bench for GDDR7 Characterization and Test
BENEFITS
Fastest time to market: perform deep memory read/write operations and characterize electrical and timing specifications
Most capable PAM3 signaling: leveraging years of expertise in SerDes technology, the PAM3 pin-electronics exceed the requirements of the GDDR7 specifications
Automated: scripting capability ideal for debug tasks, verification, and full‐fledged production screening of devices and system boards
M5512 GDDR7内存测试系统
用于GDDR7表征和测试的台架ATE
利益
最快上市时间：执行深度内存读/写操作，并确定电气和时序规格
最强大的PAM3信号：利用SerDes技术多年的专业知识，PAM3引脚电子器件超过了GDDR7规范的要求
自动化：脚本功能非常适合调试任务、验证以及设备和系统板的全面生产筛选
